CHANNEL PLATE IMAGE CONVERTER IN ARGON FIELD-ION MICROSCOPY

被引：13

作者：

LEWIS, R

GOMER, R

机构：

[1] James Franck Institute, Department of Chemistry, University of Chicago, Chicago

来源：

APPLIED PHYSICS LETTERS | 1969年 / 15卷 / 11期

关键词：

D O I：

10.1063/1.1652869

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A field-ion microscope utilizing an internal channel plate ion-to-electron converter is described and some results with He and Ar are presented. The device is shown to have excellent resolution, and a gain of ∼ 103 for He and ∼ 102 for Ar, relative to unintensified He micrographs. Good imaging of clean W surfaces can be achieved at 2 V/Å by using ultrapure Ar and ultrahigh vacuum; Ar imaging of adsorbed impurities occurs at 1.7 V/Å. © 1969 The American Institute of Physics.

引用

页码：384 / +

页数：1

共 7 条

[1] MCKINNEY JT, 1969, 16 FIELD EM S PITTSB
[2] FIELD ION MICROSCOPY WITH EXTERNAL IMAGE INTENSIFIER
MCLANE, SB
NISHIKAWA, O
MULLER, EW
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1964, 35 (10) : 1297 - &
[3] MULLER EW, 1969, 16 FIELD EM S PITTSB
[4] OPERATION OF FIELD ION MICROSCOPE WITH NEON
NISHIKAWA, O
MULLER, EW
[J]. JOURNAL OF APPLIED PHYSICS, 1964, 35 (10) : 2806 - &
[5] USE OF A CHANNELLED IMAGE INTENSIFIER IN FIELD-ION MICROSCOPE
TURNER, PJ
CARTWRIGHT, P
SOUTHON, MJ
VANOOSTR.A
MANLEY, BW
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1969, 2 (08): : 731 - +
[6] VANOOSTROM A, 1969, 16 FIELD EM S PITTSB
[7] WILEY WC, 1962, IRE T NUCL SCI, VNS9, P103, DOI DOI 10.1109/TNS2.1962.4315981

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