X-RAY-DIFFRACTION STUDY OF FE/MGO MULTILAYERED FILMS WITH AN ENHANCED MAGNETIZATION

被引：16

作者：

KOYANO, T

KITA, E

OHSHIMA, K

TASAKI, A

机构：

[1] Inst. of Appl. Phys., Tsukuba Univ.

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1991年 / 3卷 / 32期

关键词：

D O I：

10.1088/0953-8984/3/32/001

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Fe atoms in Fe (16 angstrom)/MgO (60 angstrom) multilayered films, prepared in UHV conditions, have been identified as having the same BCC structure as for the bulk specimens, using x-ray diffraction. The lattice parameter for the Fe atoms was found to be larger than the bulk value by 1.0%. Such a lattice dilation is related to the enhancements in magnetization and hyperfine field of Fe atoms in Fe/MgO multilayered films.

引用

页码：5921 / 5926

页数：6

共 26 条

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