FOCUSING OF INTENSE ION-BEAMS FROM PINCHED-BEAM DIODES

被引：46

作者：

GOLDSTEIN, SA ^{[1
]}

COOPERSTEIN, G ^{[1
]}

LEE, R ^{[1
]}

MOSHER, D ^{[1
]}

STEPHANAKIS, SJ ^{[1
]}

机构：

[1] USN,RES LAB,WASHINGTON,DC 20375

来源：

关键词：

D O I：

10.1103/PhysRevLett.40.1504

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：1504 / 1507

页数：4

共 13 条

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[2] BLAUGRUND AE, 1975, B AM PHYS SOC, V20, P1252
[3] GOLDSTEIN SA, 1975, B AM PHYS SOC, V20, P1252
[4] MILLER PA, SAND765122 SAND LAB
[5] MOSHER D, 2ND P INT C EL ION B
[6] NUCKOLLS JH, 1977, B AM PHYS SOC, V22, P1089
[7] 2-DIMENSIONAL ION EFFECTS IN RELATIVISTIC DIODES
POUKEY, JW
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (06): : 1214 - 1217
[8] FOCUSED INTENSE ION-BEAMS USING SELF-PINCHED RELATIVISTIC ELECTRON-BEAMS
POUKEY, JW
FREEMAN, JR
CLAUSER, MJ
YONAS, G
[J]. PHYSICAL REVIEW LETTERS, 1975, 35 (26) : 1806 - 1808
[9] SHYKE A, 1975, PHYSICAL REVIEW LETT, V35, P1079
[10] PRODUCTION OF INTENSE PROTON-BEAMS IN PINCHED-ELECTRON-BEAM DIODES
STEPHANAKIS, SJ
MOSHER, D
COOPERSTEIN, G
BOLLER, JR
GOLDEN, J
GOLDSTEIN, SA
[J]. PHYSICAL REVIEW LETTERS, 1976, 37 (23) : 1543 - 1546