THE RELIABILITY OF INTERNAL STANDARDS FOR CALIBRATING ELECTRON MICROSCOPES

被引：17

作者：

WATSON, JHL

GRUBE, WL

机构：

来源：

关键词：

D O I：

10.1063/1.1702304

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：793 / 798

页数：6

共 8 条

[1] SMALL SPHERICAL PARTICLES OF EXCEPTIONALLY UNIFORM SIZE [J].

BACKUS, RC ;

WILLIAMS, RC .

[2]

BACKUS RC, 1948, J APPL PHYS, V19, P1186

GEROULD, CH .

[4]

GRUBE WL, 1952, ASTM B, V179

[5]

MONK GS, 1937, LIGHT PRINCIPLES EXP, P426

[6]

Schaefer Vincent J., 1943, SCIENCE, V97, P188, DOI 10.1126/science.97.2512.188

[7] NEGATIVE CHARGING OF GLASS FIBERS UNDER ELECTRON BOMBARDMENT [J].

WATSON, JHL .

[8] LATEX PARTICLE SIZE FROM X-RAY DIFFRACTION PEAKS [J].

YUDOWITCH, KL .