EVIDENCE OF ESCAPE PEAKS CAUSED BY A SI(LI) DETECTOR IN ENERGY-DISPERSIVE DIFFRACTION SPECTRA

被引:5
作者
BURAS, B
OLSEN, JS
ANDERSEN, AL
GERWARD, L
SELSMARK, B
机构
[1] UNIV COPENHAGEN,HC ORSTED INST,PHYS LAB 2,DK-2100 COPENHAGEN,DENMARK
[2] TECH UNIV DENMARK,LAB APPL PHYS 3,DK-2800 LYNGBY,DENMARK
关键词
D O I
10.1107/S0021889874009587
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:296 / 297
页数:2
相关论文
共 4 条
[1]  
BURAS B, 1973, 7312 U COP HC ORST I
[2]  
BURAS B, 4 TU DENM LAB APPL P
[3]   ESCAPE PEAKS CAUSED BY A GE(LI) DETECTOR IN AN ENERGY-DISPERSIVE DIFFRACTOMETER [J].
FUKAMACHI, T ;
TOGAWA, S ;
HOSOYA, S .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1973, 6 (AUG1) :297-298
[4]  
Woldseth R., 1973, XRAY ENERGY SPECTROM