XRF ANALYSIS - SOME SENSITIVITY COMPARISONS BETWEEN CHARGED-PARTICLE AND PHOTON EXCITATION

被引:52
作者
GOULDING, FS [1 ]
JAKLEVIC, JM [1 ]
机构
[1] UNIV CALIF BERKELEY,LAWRENCE BERKELEY LAB,BERKELEY,CA 94720
来源
NUCLEAR INSTRUMENTS & METHODS | 1977年 / 142卷 / 1-2期
关键词
D O I
10.1016/0029-554X(77)90846-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:323 / 332
页数:10
相关论文
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