INTERFACE ELECTRONIC-STRUCTURE FROM ELLIPSOMETRY COUPLED WITH DIFFERENTIAL CAPACITY MEASUREMENTS

被引：9

作者：

CHAO, F

COSTA, M

LECOEUR, J

BELLIER, JP

机构：

来源：

ELECTROCHIMICA ACTA | 1989年 / 34卷 / 12期

关键词：

D O I：

10.1016/0013-4686(89)85040-6

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：1627 / 1638

页数：12

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