DIRECT RETRIEVAL OF CRYSTAL-STRUCTURE FACTORS IN THEED

被引：20

作者：

PENG, LM

ZUO, JM

机构：

[1] UNIV OXFORD,DEPT MAT,OXFORD OX1 3PH,ENGLAND

[2] ARIZONA STATE UNIV,DEPT PHYS & ASTRON,TEMPE,AZ 85287

来源：

ULTRAMICROSCOPY | 1995年 / 57卷 / 01期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0304-3991(94)00193-Q

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A linear model and a non-linear quadratic model for transmission high-energy electron diffraction (THEED) have been developed and applied to invert crystal structure factors directly from energy-filtered convergent beam electron diffraction (CBED) intensities. The models are based on perturbation theory of high-energy electron diffraction, and the unperturbated reference structure factors are constructed from an assembly of neutral atoms. The single and double diffraction approximations used in the linear and quadratic models are: shown to be good approximations for describing the redistributed charge scattering in crystals, and the inverted crystal structure factors are shown to be unique for all practical sample thicknesses used in THEED.

引用

页码：1 / 9

页数：9

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