An X-ray method of determining rates of diffusion in the solid state

被引:145
作者
DuMond, J [1 ]
Youtz, JP [1 ]
机构
[1] CALTECH, Pasadena, CA USA
关键词
D O I
10.1063/1.1712784
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:357 / 365
页数:9
相关论文
共 4 条
  • [1] Deubner W, 1930, ANN PHYS-BERLIN, V5, P261
  • [2] Selective x-ray diffraction from artificially stratified metal films deposited by evaporation
    Dumond, JWM
    Youtz, JP
    [J]. PHYSICAL REVIEW, 1935, 48 (08): : 703 - 703
  • [3] FOWLER, 1936, STAT MECH, P770
  • [4] KOEPPE H, 1923, THESIS GIESZEN