X-RAY PHOTOELECTRON-SPECTROSCOPY OF SODIUM-PHOSPHATE GLASSES

被引：219

作者：

GRESCH, R ^{[1
]}

MULLERWARMUTH, W ^{[1
]}

DUTZ, H ^{[1
]}

机构：

[1] JENAER GLASWERK SCHOTT GEN,MAINZ,FED REP GER

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1979年 / 34卷 / 01期

关键词：

D O I：

10.1016/0022-3093(79)90012-7

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

X-ray photoelectron spectroscopy (XPS, ESCA) has been applied to sodium phosphate glasses with compositions between 15 and 50 mol% Na2O and for the purpose of comparison also to crystalline compounds containing oxygen and phosphorus. From the measurements a discrimination between bridging and non-bridging oxygen atoms was possible. The method provides a quantitative technique for structural analysis of phosphate glasses. © 1979.

引用

页码：127 / 136

页数：10

共 8 条

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[2] CARLSON RA, 1975, PHOTOELECTRON AUGER
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FLUCK, E
WEBER, D
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[4] Goretzki, 1976, GLASTECH BER, V49, P211
[5] Goretzki, 1978, GLASTECH BER, V51, P1
[6] LATHAM D, 1974, J ELECTRON SPECTROSC, V3, P241
[7] FACTORS AFFECTING QUANTITATIVE-DETERMINATIONS BY X-RAY PHOTOELECTRON-SPECTROSCOPY
WAGNER, CD
[J]. ANALYTICAL CHEMISTRY, 1977, 49 (09) : 1282 - 1290
[8] CORE BINDING ENERGY DIFFERENCE BETWEEN BRIDGING AND NONBRIDGING OXYGEN ATOMS IN A SILICATE CHAIN
YIN, LI
GHOSE, S
ADLER, I
[J]. SCIENCE, 1971, 173 (3997) : 633 - &

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