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X-RAY PHOTOELECTRON-SPECTROSCOPY OF SODIUM-PHOSPHATE GLASSES
被引:219
作者
:
GRESCH, R
论文数:
0
引用数:
0
h-index:
0
机构:
JENAER GLASWERK SCHOTT GEN,MAINZ,FED REP GER
JENAER GLASWERK SCHOTT GEN,MAINZ,FED REP GER
GRESCH, R
[
1
]
MULLERWARMUTH, W
论文数:
0
引用数:
0
h-index:
0
机构:
JENAER GLASWERK SCHOTT GEN,MAINZ,FED REP GER
JENAER GLASWERK SCHOTT GEN,MAINZ,FED REP GER
MULLERWARMUTH, W
[
1
]
DUTZ, H
论文数:
0
引用数:
0
h-index:
0
机构:
JENAER GLASWERK SCHOTT GEN,MAINZ,FED REP GER
JENAER GLASWERK SCHOTT GEN,MAINZ,FED REP GER
DUTZ, H
[
1
]
机构
:
[1]
JENAER GLASWERK SCHOTT GEN,MAINZ,FED REP GER
来源
:
JOURNAL OF NON-CRYSTALLINE SOLIDS
|
1979年
/ 34卷
/ 01期
关键词
:
D O I
:
10.1016/0022-3093(79)90012-7
中图分类号
:
TQ174 [陶瓷工业];
TB3 [工程材料学];
学科分类号
:
0805 ;
080502 ;
摘要
:
X-ray photoelectron spectroscopy (XPS, ESCA) has been applied to sodium phosphate glasses with compositions between 15 and 50 mol% Na2O and for the purpose of comparison also to crystalline compounds containing oxygen and phosphorus. From the measurements a discrimination between bridging and non-bridging oxygen atoms was possible. The method provides a quantitative technique for structural analysis of phosphate glasses. © 1979.
引用
收藏
页码:127 / 136
页数:10
相关论文
共 8 条
[1]
BRION D, 1976, J MICROSC SPECT ELEC, V1, P227
[2]
CARLSON RA, 1975, PHOTOELECTRON AUGER
[3]
X-RAY PHOTOELECTRON-SPECTROSCOPY AND APPLICATION TO PHOSPHORUS CHEMISTRY
FLUCK, E
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV STUTTGART,INST ANORG CHEM,STUTTGART,FED REP GER
UNIV STUTTGART,INST ANORG CHEM,STUTTGART,FED REP GER
FLUCK, E
WEBER, D
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV STUTTGART,INST ANORG CHEM,STUTTGART,FED REP GER
UNIV STUTTGART,INST ANORG CHEM,STUTTGART,FED REP GER
WEBER, D
[J].
PURE AND APPLIED CHEMISTRY,
1975,
44
(02)
: 373
-
391
[4]
Goretzki, 1976, GLASTECH BER, V49, P211
[5]
Goretzki, 1978, GLASTECH BER, V51, P1
[6]
LATHAM D, 1974, J ELECTRON SPECTROSC, V3, P241
[7]
FACTORS AFFECTING QUANTITATIVE-DETERMINATIONS BY X-RAY PHOTOELECTRON-SPECTROSCOPY
WAGNER, CD
论文数:
0
引用数:
0
h-index:
0
机构:
SHELL DEV CO,HOUSTON,TX 77001
SHELL DEV CO,HOUSTON,TX 77001
WAGNER, CD
[J].
ANALYTICAL CHEMISTRY,
1977,
49
(09)
: 1282
-
1290
[8]
CORE BINDING ENERGY DIFFERENCE BETWEEN BRIDGING AND NONBRIDGING OXYGEN ATOMS IN A SILICATE CHAIN
YIN, LI
论文数:
0
引用数:
0
h-index:
0
YIN, LI
GHOSE, S
论文数:
0
引用数:
0
h-index:
0
GHOSE, S
ADLER, I
论文数:
0
引用数:
0
h-index:
0
ADLER, I
[J].
SCIENCE,
1971,
173
(3997)
: 633
-
&
←
1
→
共 8 条
[1]
BRION D, 1976, J MICROSC SPECT ELEC, V1, P227
[2]
CARLSON RA, 1975, PHOTOELECTRON AUGER
[3]
X-RAY PHOTOELECTRON-SPECTROSCOPY AND APPLICATION TO PHOSPHORUS CHEMISTRY
FLUCK, E
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV STUTTGART,INST ANORG CHEM,STUTTGART,FED REP GER
UNIV STUTTGART,INST ANORG CHEM,STUTTGART,FED REP GER
FLUCK, E
WEBER, D
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV STUTTGART,INST ANORG CHEM,STUTTGART,FED REP GER
UNIV STUTTGART,INST ANORG CHEM,STUTTGART,FED REP GER
WEBER, D
[J].
PURE AND APPLIED CHEMISTRY,
1975,
44
(02)
: 373
-
391
[4]
Goretzki, 1976, GLASTECH BER, V49, P211
[5]
Goretzki, 1978, GLASTECH BER, V51, P1
[6]
LATHAM D, 1974, J ELECTRON SPECTROSC, V3, P241
[7]
FACTORS AFFECTING QUANTITATIVE-DETERMINATIONS BY X-RAY PHOTOELECTRON-SPECTROSCOPY
WAGNER, CD
论文数:
0
引用数:
0
h-index:
0
机构:
SHELL DEV CO,HOUSTON,TX 77001
SHELL DEV CO,HOUSTON,TX 77001
WAGNER, CD
[J].
ANALYTICAL CHEMISTRY,
1977,
49
(09)
: 1282
-
1290
[8]
CORE BINDING ENERGY DIFFERENCE BETWEEN BRIDGING AND NONBRIDGING OXYGEN ATOMS IN A SILICATE CHAIN
YIN, LI
论文数:
0
引用数:
0
h-index:
0
YIN, LI
GHOSE, S
论文数:
0
引用数:
0
h-index:
0
GHOSE, S
ADLER, I
论文数:
0
引用数:
0
h-index:
0
ADLER, I
[J].
SCIENCE,
1971,
173
(3997)
: 633
-
&
←
1
→