HIGH-RESOLUTION PHOTOACOUSTIC THERMAL-WAVE MICROSCOPY

被引：149

作者：

ROSENCWAIG, A ^{[1
]}

BUSSE, G ^{[1
]}

机构：

[1] HSCH BUNDESWEHR MUNCHEN,ZWE PHYS,D-8014 NEUBIBERG,FED REP GER

来源：

关键词：

D O I：

10.1063/1.91646

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：725 / 727

页数：3

共 7 条

[1] SUBSURFACE IMAGING WITH PHOTOACOUSTICS
BUSSE, G
ROSENCWAIG, A
[J]. APPLIED PHYSICS LETTERS, 1980, 36 (10) : 815 - 816
[2] LUUKKALA M, 1979, ELECTRON LETT, V15, P326
[3] ROSENCWAIG A, 1979, AM LAB, V11, P39
[4] ROSENCWAIG A, UNPUBLISHED
[5] SUBSURFACE FLAW DETECTION IN METALS BY PHOTOACOUSTIC MICROSCOPY
THOMAS, RL
POUCH, JJ
WONG, YH
FAVRO, LD
KUO, PK
ROSENCWAIG, A
[J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (02) : 1152 - 1156
[6] PHOTO-ACOUSTICS ON A MICROSCOPIC SCALE
WICKRAMASINGHE, HK
BRAY, RC
JIPSON, V
QUATE, CF
SALCEDO, JR
[J]. APPLIED PHYSICS LETTERS, 1978, 33 (11) : 923 - 925
[7] SUBSURFACE STRUCTURES OF SOLIDS BY SCANNING PHOTOACOUSTIC MICROSCOPY
WONG, YH
THOMAS, RL
POUCH, JJ
[J]. APPLIED PHYSICS LETTERS, 1979, 35 (05) : 368 - 369