INSULATING NANOPARTICLES ON YBA2CU3O7-DELTA THIN-FILMS REVEALED BY COMPARISON OF ATOMIC-FORCE AND SCANNING-TUNNELING-MICROSCOPY

被引：15

作者：

THOMSON, RE ^{[1
]}

MORELAND, J ^{[1
]}

MISSERT, N ^{[1
]}

RUDMAN, DA ^{[1
]}

SANDERS, SC ^{[1
]}

COLE, BF ^{[1
]}

机构：

[1] CONDUCTUS,SUNNYVALE,CA 94086

来源：

APPLIED PHYSICS LETTERS | 1993年 / 63卷 / 05期

关键词：

D O I：

10.1063/1.109966

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The surface topography of YBa2Cu3O7-delta thin films has been studied with both atomic force microscopy (AFM) and scanning tunneling microscopy (STM). The AFM images reveal a high density of small distinct nanoparticles, 10-50 nm across and 5-20 nm high, which do not appear in STM images of the same samples. In addition, we have shown that scanning the STM tip across the surface breaks off these particles and moves them to the edge of the scanned area, where they can later be imaged with the AFM.

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页码：614 / 616

页数：3

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