HIGH-ACCURACY CIRCUITS FOR ON-CHIP CAPACITANCE RATIO TESTING OR SENSOR READOUT

被引：44

作者：

CAO, YM

TEMES, GC

机构：

[1] Department of Electrical and Computer Engineering, Oregon State University, Corvallis, OR

来源：

IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING | 1994年 / 41卷 / 09期

关键词：

D O I：

10.1109/82.326597

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Novel CMOS circuits are described for the on-chip measurement of capacitor ratios. They can provide a high-accuracy A/D interface for capacitive sensors, or allow the precise calibration of switched-capacitor DACs, amplifiers and other circuits utilizing ratioed capacitors. Various structures are proposed and the limitations of their accuracy are analyzed. Computer simulations illustrate the operation and verify the anticipated robustness and high accuracy of the system even in the presence of nonidealities.

引用

页码：637 / 639

页数：3

共 6 条

[1]

BASCHIROTTO A, 1990, IEEE P ISCAS MAY, P2813

[2] A DIGITAL READOUT TECHNIQUE FOR CAPACITIVE SENSOR APPLICATIONS [J].