ELECTRONICALLY-SCANNED WHITE-LIGHT INTERFEROMETRY WITH ENHANCED DYNAMIC-RANGE

被引：20

作者：

CHEN, S ^{[1
]}

MEGGITT, BT ^{[1
]}

ROGERS, AJ ^{[1
]}

机构：

[1] SIRA INST LTD,CHISLEHURST BR7 5EH,KENT,ENGLAND

来源：

ELECTRONICS LETTERS | 1990年 / 26卷 / 20期

关键词：

Interferometers; Measurement;

D O I：

10.1049/el:19901065

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

When a CCD array is used to detect the spatial fringes of optical interference, interesting features emerge in the output as the width of each fringe approaches the dimension of a CCD sensing cell. These features are theoretically studied and their application to the enhancement of the dynamic operating range of electrically scanned white-light interferometry is investigated. Preliminary experimental results are presented. © 1990, The Institution of Electrical Engineers. All rights reserved.

引用

页码：1663 / 1665

页数：3

共 6 条

[1] NOVEL ELECTRONIC SCANNER FOR COHERENCE MULTIPLEXING IN A QUASI-DISTRIBUTED PRESSURE SENSOR
CHEN, S
MEGGITT, BT
ROGERS, AJ
[J]. ELECTRONICS LETTERS, 1990, 26 (17) : 1367 - 1369
[2] FIBRE-OPTIC INTERFEROMETRIC SENSOR UTILIZING LOW COHERENCE LENGTH SOURCE - RESOLUTION ENHANCEMENT
GERGES, AS
FARAHI, F
NEWSON, TP
JONES, JDC
JACKSON, DA
[J]. ELECTRONICS LETTERS, 1988, 24 (08) : 472 - 474
[3] INTERFEROMETRIC FIBEROPTIC SENSOR USING A SHORT-COHERENCE-LENGTH SOURCE
GERGES, AS
FARAHI, F
NEWSON, TP
JONES, JDC
JACKSON, DA
[J]. ELECTRONICS LETTERS, 1987, 23 (21) : 1110 - 1111
[4] KOCH A, 1990, MAR INT C OPT SCI EN
[5] TROUCHET D, 1989, SPRINGER P PHYSICS, V44, P227
[6] ULRICH R, 1989, SPRINGER P PHYSICS, V44, P62

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