LIFETIMES OF NEUTRAL AND SINGLY-IONIZED GERMANIUM

被引：9

作者：

TINT, K

KONO, A

GOTO, T

机构：

[1] Department of Electronics, School of Engineering, Nagoya University, Chikusa-ku, Nagoya, 464, Furo-cho

来源：

JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER | 1990年 / 43卷 / 06期

关键词：

D O I：

10.1016/0022-4073(90)90125-P

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The radiative lifetimes of the Ge I 4p5s and 4p4d and Ge II 4f2 F and 5p 2P levels were measured by using the delayed-coincidence technique. The results for the Ge I 4p5s and Ge II levels generally agree with data reported for beam-foil experiments. For the Ge I 4p4d levels, our lifetime data show some inconsistency with the reported transition probabilities based on emission measurements. © 1990.

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页码：427 / 431

页数：5

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