CHARACTERISTICS IN INGAAS-INP AVALANCHE PHOTO-DIODES WITH SEPARATED ABSORPTION AND MULTIPLICATION REGIONS

被引:43
作者
SUSA, N
NAKAGOME, H
ANDO, H
KANBE, H
机构
关键词
D O I
10.1109/JQE.1981.1071059
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:243 / 250
页数:8
相关论文
共 31 条
[1]   OBSERVATION OF ETCH PITS PRODUCED IN INP BY NEW ETCHANTS [J].
AKITA, K ;
KUSUNOKI, T ;
KOMIYA, S ;
KOTANI, T .
JOURNAL OF CRYSTAL GROWTH, 1979, 46 (06) :783-787
[2]   TUNNELING CURRENT IN INGAAS AND OPTIMUM DESIGN FOR INGAAS-INP AVALANCHE PHOTO-DIODE [J].
ANDO, H ;
KANBE, H ;
ITO, M ;
KANEDA, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (06) :L277-L280
[3]   INGAAS-INP SEPARATED ABSORPTION AND MULTIPLICATION REGIONS AVALANCHE PHOTO-DIODE USING LIQUID-PHASE AND VAPOR-PHASE EPITAXIES [J].
ANDO, H ;
YAMAUCHI, Y ;
NAKAGOME, H ;
SUSA, N ;
KANBE, H .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1981, 17 (02) :250-254
[4]   CHARACTERISTICS OF GERMANIUM AVALANCHE PHOTO-DIODES IN WAVELENGTH REGION OF 1-1.6 MU-M [J].
ANDO, H ;
KANBE, H ;
KIMURA, T ;
YAMAOKA, T ;
KANEDA, T .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1978, 14 (11) :804-809
[5]   IONIZATION COEFFICIENTS OF ELECTRONS AND HOLES IN INP [J].
ARMIENTO, CA ;
GROVES, SH ;
HURWITZ, CE .
APPLIED PHYSICS LETTERS, 1979, 35 (04) :333-335
[6]  
DEVLIN WJ, 1978, 7TH P INT S GALL ARS, P150
[7]  
DIADIUK V, 1980, 38TH ANN DEV RES C I
[8]   EVIDENCE FOR TUNNELING IN REVERSE-BIASED III-V PHOTODETECTOR DIODES [J].
FORREST, SR ;
DIDOMENICO, M ;
SMITH, RG ;
STOCKER, HJ .
APPLIED PHYSICS LETTERS, 1980, 36 (07) :580-582
[9]  
HSIEH JJ, 1974, J CRYST GROWTH, V27, P49, DOI 10.1016/0022-0248(74)90418-7
[10]  
ITO M, UNPUBLISHED