F2 REACTION DYNAMICS WITH DEFECTIVE SI(100) - DEFECT-INSENSITIVE SURFACE-CHEMISTRY

被引:25
作者
CARTER, LE [1 ]
CARTER, EA [1 ]
机构
[1] UNIV CALIF LOS ANGELES,DEPT CHEM & BIOCHEM,LOS ANGELES,CA 90024
基金
美国国家科学基金会;
关键词
ADSORPTION KINETICS; ETCHING; HALOGENS; MODELS OF SURFACE CHEMICAL REACTIONS; MOLECULAR DYNAMICS; SILICON; SURFACE DEFECTS;
D O I
10.1016/0039-6028(94)00622-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We have investigated the influence of a variety of dimer vacancy defects on the reactivity of F-2 molecules with the clean Si(100)-2 X 1 reconstructed surface via molecular dynamics using an ab-initio-derived Stillinger-Weber-type many-body potential. Our simulations of a wide variety of defective surfaces indicate that vacancy defects have a negligible effect on the reactivity of F-2 molecules toward the Si surface. These simulations suggest that the density of accessible Si dangling bonds (i.e., the number of reactive surface sites) is the sole critical factor in determining the reactivity for this highly exothermic surface reaction. Thus, defective Si(100) exhibits essentially the same reactivity toward F-2 as a perfect Si(100)-2 X 1 surface.
引用
收藏
页码:39 / 50
页数:12
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