ANTIREFLECTION PROPERTIES OF INDIUM TIN OXIDE (ITO) ON SILICON FOR PHOTO-VOLTAIC APPLICATIONS

被引:19
作者
CHEEK, G [1 ]
GENIS, A [1 ]
DUBOW, JB [1 ]
PAIVERNEKER, VR [1 ]
机构
[1] INDIAN INST SCI,DEPT INORGAN & PHYS CHEM,BANGALORE 560012,INDIA
关键词
D O I
10.1063/1.91184
中图分类号
O59 [应用物理学];
学科分类号
摘要
The short-circuit current density (Jsc) of indium tin oxide (ITO/silicon solar cells has been shown both theoretically and experimentally to be a function of the thickness of the ion beam sputtered ITO layer. These results can be accounted for by computing the optical reflection from the ITO/silicon interface.
引用
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页码:495 / 497
页数:3
相关论文
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