SEMICONDUCTOR INSTABILITY FAILURE MECHANISMS REVIEW

[1] ATTALA MM, 1960, P IEEE B S17, V106, P1130

[2] BROWN GA, 1973, 11TH ANN P INT REL P, P203

[3] COOK BR, UNPUBLISHED

[4] CURRY JJ, 1970, 8 ANN P REL PHYS, P29

[5] DAVIS W, 1976, ANALOG DESIGN, V2

[6] DAVIS W, 1969, PARASITIC MOS FORMAT

[7] DONOVAN RP, 1966, PHYSICS FAILURE ELEC, V5, P199

[8] FITCH WT, 1979 P EL COMP C

[9] FITZGERALD DJ, 1965, PHYS FAIL ELECTRON, V4, P315

[10] FOGIEL M, 1972, MICROELECTRONICS

[1] ATTALA MM, 1960, P IEEE B S17, V106, P1130

[2] BROWN GA, 1973, 11TH ANN P INT REL P, P203

[3] COOK BR, UNPUBLISHED

[4] CURRY JJ, 1970, 8 ANN P REL PHYS, P29

[5] DAVIS W, 1976, ANALOG DESIGN, V2

[6] DAVIS W, 1969, PARASITIC MOS FORMAT

[7] DONOVAN RP, 1966, PHYSICS FAILURE ELEC, V5, P199

[8] FITCH WT, 1979 P EL COMP C

[9] FITZGERALD DJ, 1965, PHYS FAIL ELECTRON, V4, P315

[10] FOGIEL M, 1972, MICROELECTRONICS