SEMICONDUCTOR INSTABILITY FAILURE MECHANISMS REVIEW

被引:31
作者
LYCOUDES, NE
CHILDERS, CC
机构
关键词
D O I
10.1109/TR.1980.5220810
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
引用
收藏
页码:237 / 249
页数:13
相关论文
共 46 条
  • [1] ATTALA MM, 1960, P IEEE B S17, V106, P1130
  • [2] BROWN GA, 1973, 11TH ANN P INT REL P, P203
  • [3] COOK BR, UNPUBLISHED
  • [4] CURRY JJ, 1970, 8 ANN P REL PHYS, P29
  • [5] DAVIS W, 1976, ANALOG DESIGN, V2
  • [6] DAVIS W, 1969, PARASITIC MOS FORMAT
  • [7] DONOVAN RP, 1966, PHYSICS FAILURE ELEC, V5, P199
  • [8] FITCH WT, 1979 P EL COMP C
  • [9] FITZGERALD DJ, 1965, PHYS FAIL ELECTRON, V4, P315
  • [10] FOGIEL M, 1972, MICROELECTRONICS