METHOD FOR ACCURATELY DETERMINING LATTICE-PARAMETERS USING ELECTRON-DIFFRACTION IN A COMMERCIAL ELECTRON-MICROSCOPE

被引：13

作者：

LODDER, JC ^{[1
]}

BERG, KGVD ^{[1
]}

机构：

[1] TWENTE UNIV TECHNOL,DEPT ELECT ENGN,ENSCHEDE,NETHERLANDS

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1974年 / 100卷 / JAN期

关键词：

D O I：

10.1111/j.1365-2818.1974.tb03916.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：93 / 98

页数：6

共 12 条

[1]

Andrews K.W., 1967, INTERPRETATION ELECT

[2]

BEU KE, 1962, SPEC TECH PUBLS AM S, V339, P6

[3]

GORINGE MJ, 1968, 4 P EUR REG C EL MIC, V1, P41

[4]

HALL CE, 1966, INTRO ELECTRON MICRO

[5] THE LATTICE CONSTANTS AND EXPANSION COEFFICIENTS OF SOME HALIDES [J].

HAMBLING, PG .

ACTA CRYSTALLOGRAPHICA, 1953, 6 (01) :98-98

[6] MANGANESE FERRITE THIN-FILMS .1. PREPARATION AND STRUCTURE [J].

HULSCHER, WS ;

BERG, KGVD ;

LODDER, JC .

[7]

KAY DH, 1965, TECHNIQUES ELECTRON

MEYERHOFF, K .

ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1957, 12 (01) :23-&

[9]

RAKELS CJ, 1968, PHILIPS TECH REV, V29, P370

[10]

Rymer T. B., 1970, ELECTRON DIFFRACTION