FUNDAMENTAL STUDIES ON QUANTITATIVE-ANALYSIS IN ION PROBE MICROANALYZER

被引：32

作者：

SHIMIZU, R ^{[1
]}

ISHITANI, T ^{[1
]}

UESHIMA, Y ^{[1
]}

机构：

[1] OSAKA UNIV,DEPT APPL PHYS,SUITA,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1974年 / 13卷 / 02期

关键词：

D O I：

10.1143/JJAP.13.249

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：249 / 255

页数：7

共 13 条

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SURFACE SCIENCE, 1971, 28 (02) :541-+

[3] UNTERSUCHUNGEN ZUR EMISSION POSITIVER SEKUNDARIONEN AUS FESTEN TARGETS . DIE BRAUCHBARKEIT DER IONENBESCHUSS-IONENQUELLE IN DER MASSENSPEKTROSKOPIE [J].

BESKE, HE .

ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1967, A 22 (04) :459-+

[4]

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[5] IONIC SECONDARY EMISSION OF CUAL ALLOYS IN OXYGEN ATMOSPHERE [J].

BROCHARD, D ;

SLODZIAN, G .

JOURNAL DE PHYSIQUE, 1971, 32 (2-3) :185-&

[6]

Carter G., 1968, ION BOMBARDMENT SOLI

[7]

CASTAING R, 1972, 6TH P INT C XRAY OPT, P399

[8] ELECTRONIC PARTITION FUNCTIONS OF ATOMS AND IONS BETWEEN 1500 DEGREES K AND 7000 DEGREES K [J].

DEGALAN, L ;

SMITH, R ;

WINEFORDNER, JD .

SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1968, B 23 (08) :521-+

[9]

DRAWIN HW, 1965, DADA PLASMAS LOCAL T

[10]

DRAWIN HW, 1971, REACTION UNDER PLASM, V1

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