Switching phenomena ha.ve been observed in a number of semiconducting glasses from the system. As, Se, Te, Tl. Two distinct switching phenomena were seen, one, a slow process which occurred in thick samples, and the other, a much faster process which occurred in thinner samples. Analyses are presented for two extreme cases of thermal switching (or breakdown). Comparison of the experimental results with the theoretical predictions indicates that the observed slow process is thermal in origin, whereas the faster process is non-thermal. © Taylor and Francis Group, LLC.