A1 SURFACE RELAXATION USING SURFACE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE

被引：73

作者：

BIANCONI, A

BACHRACH, RZ

机构：

[1] STANFORD UNIV,STANFORD SYNCHROTRON RADIAT LAB,STANFORD,CA 94305

[2] XEROX CORP,PALO ALTO RES CTR,PALO ALTO,CA 94304

来源：

PHYSICAL REVIEW LETTERS | 1979年 / 42卷 / 02期

关键词：

D O I：

10.1103/PhysRevLett.42.104

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The surface extended x-ray-absorption fine structure (EXAFS) of a single crystal has been measured for the first time. By comparison with parameters obtained from bulk aluminum EXAFS, a decrease of the interatomic distance (Δr=0.15±0.05 A) at the Al(111) surface has been found. No relaxation is found of the Al-Al separation on the (100) face. © 1979 The American Physical Society.

引用

页码：104 / 108

页数：5

共 18 条

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