A SIMPLE MEASURING METHOD FOR THE CHARACTERISTIC CURVE OF S(THETA) COS THETA-S(O)

被引：5

作者：

KOWALSKI, ZW

机构：

来源：

JOURNAL OF MATERIALS SCIENCE | 1981年 / 16卷 / 12期

关键词：

D O I：

10.1007/BF00586319

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3512 / 3513

页数：2

共 13 条

[1]

Bach H., 1970, Journal of Non-Crystalline Solids, V3, P1, DOI 10.1016/0022-3093(70)90102-X

[2] PREDICTION OF ION-BOMBARDED SURFACE TOPOGRAPHIES USING FRANKS KINEMATIC THEORY OF CRYSTAL DISSOLUTION [J].

BARBER, DJ ;

FRANK, FC ;

MOSS, M ;

STEEDS, JW ;

TSONG, IST .

JOURNAL OF MATERIALS SCIENCE, 1973, 8 (07) :1030-1040

[3] SECONDARY PROCESSES IN EVOLUTION OF SPUTTER-TOPOGRAPHIES [J].

BAYLY, AR .

JOURNAL OF MATERIALS SCIENCE, 1972, 7 (04) :404-&

[4]

CROCKETT CG, 1972, VACUUM, V23, P11

[5] EVOLUTION OF WELL-DEFINED SURFACE CONTOUR SUBMITTED TO ION-BOMBARDMENT - COMPUTER-SIMULATION AND EXPERIMENTAL INVESTIGATION [J].

DUCOMMUN, JP ;

CANTAGREL, M ;

MOULIN, M .

JOURNAL OF MATERIALS SCIENCE, 1975, 10 (01) :52-62

[6] IMPROVED ION THINNING APPARATUS [J].

HEUER, AH ;

FIRESTONE, RF ;

SNOW, JD ;

GREEN, HW ;

HOWE, RG ;

CHRISTIE, JM .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1971, 42 (08) :1177-+

[7] TOPOGRAPHY OF ION-ETCHED CORNING-7059 GLASS [J].

LUKASZEWICZ, M ;

KOWALSKI, ZW .

JOURNAL OF MATERIALS SCIENCE, 1981, 16 (02) :302-306

[8]

Navinsek B., 1976, Progress in Surface Science, V7, P49, DOI 10.1016/0079-6816(76)90001-0

[9] EQUILIBRIUM TOPOGRAPHY OF SPUTTERED AMORPHOUS SOLIDS [J].

NOBES, MJ ;

COLLIGON, JS ;

CARTER, G .

JOURNAL OF MATERIALS SCIENCE, 1969, 4 (08) :730-&

[10] MICROTOPOGRAPHY OF SURFACES ERODED BY ION-BOMBARDMENT [J].

STEWART, ADG ;

THOMPSON, MW .

JOURNAL OF MATERIALS SCIENCE, 1969, 4 (01) :56-&

← 1 2 →