HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SOME CARBONACEOUS MATERIALS

[1] BAN LL, 1972, SURFACE DEFECT PROPE, V1, P54

[2] THRESHOLD ENERGY FOR ELECTRON-IRRADIATION DAMAGE IN SINGLE-CRYSTAL GRAPHITE [J]. PHILOSOPHICAL MAGAZINE, 1977, 35 (05): : 1425 - 1428

[3] GRINTON GR, 1971, OPTIK, V34, P221

[4] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF AMORPHOUS THIN-FILMS [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1978, 31 (1-2) : 41 - 55

[5] IIJIMA S, 1979, CHEM SCRIPTA, V14, P117

[6] THIN GRAPHITE SUPPORT FILMS FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY [J]. MICRON, 1977, 8 (1-2) : 41 - 46

[7] IIJIMA S, 1977, OPTIK, V47, P437

[8] IIJIMA S, 1977, OPTIK, V48, P193

[9] IIJIMA S, 1977, 35TH ANN P EMSA, P194

[10] IIJIMA S, 1976, 34TH P ANN EMSA M MI, P568

[1] BAN LL, 1972, SURFACE DEFECT PROPE, V1, P54

[2] THRESHOLD ENERGY FOR ELECTRON-IRRADIATION DAMAGE IN SINGLE-CRYSTAL GRAPHITE [J]. PHILOSOPHICAL MAGAZINE, 1977, 35 (05): : 1425 - 1428

[3] GRINTON GR, 1971, OPTIK, V34, P221

[4] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF AMORPHOUS THIN-FILMS [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1978, 31 (1-2) : 41 - 55

[5] IIJIMA S, 1979, CHEM SCRIPTA, V14, P117

[6] THIN GRAPHITE SUPPORT FILMS FOR HIGH-RESOLUTION ELECTRON-MICROSCOPY [J]. MICRON, 1977, 8 (1-2) : 41 - 46

[7] IIJIMA S, 1977, OPTIK, V47, P437

[8] IIJIMA S, 1977, OPTIK, V48, P193

[9] IIJIMA S, 1977, 35TH ANN P EMSA, P194

[10] IIJIMA S, 1976, 34TH P ANN EMSA M MI, P568