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NUCLEAR MICROSCOPY OF SINGLE AEROSOL-PARTICLES

被引：16
作者：
ORLIC, I
WATT, F
LOH, KK
TANG, SM
机构：
[1] Department of Physics, National University of Singapore, Singapore, 0511, Lower Kent Ridge Road
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1994年 / 85卷 / 1-4期
关键词：
D O I：
10.1016/0168-583X(94)95934-X
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The Nuclear Microscope at the National University of Singapore is being used for the analysis of single aerosol particles. The methodology of utilizing off-axis Scanning Transmission Ion Microscopy (STIM) to identify and characterize the size and shape of the particles, Rutherford backscattering (RBS) to determine the matrix composition and effective thickness, and Particle Induced X-ray Emission (PIXE) to determine the minor and trace elements to the ppm level, is presented. Thin film pioloform substrates are found to be the most suitable backing material for the single particle analysis.
引用
收藏
页码：840 / 844
页数：5
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