LIFETIME MEASUREMENTS IN NE-22,SI-28 AND P-31 RELEVANT TO THE INTERPRETATION OF THE Z2 VARIATION IN LOW VELOCITY DSAM RESULTS

Accurate lifetimes have been measured for low-lying levels in 22Ne, 28Si and 31P by bombarding 4He implanted targets with beams of 19F and 28Si ions. Mean lifetimes determined by fitting Doppler-broadened γ-ray lineshapes were (Ex in MeV, τ in ps): 22Ne (1.275, 5.15 ± 0.31; 3.357, 0.324 ± 0.009), 28Si (1.779, 0.667 ± 0.035), 31P (1.266, 0.70 ± 0.07; 2.234, 0.363 ± 0.024). The lifetime values for the 3.357 MeV level in 22Ne and the 2.234 MeV level in 31P are used to calibrate low velocity DSAM lifetime data for these two levels and to obtain scaling factors to theoretical electronic stopping powers for Ne and P ions. © 1979.