LUMINESCENCE AND FREE CARRIER DECAY TIMES IN SEMICONDUCTORS CONTAINING ISOELECTRONIC TRAPS .1.

被引：13

作者：

CUTHBERT, JD

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1971年 / 42卷 / 02期

关键词：

D O I：

10.1063/1.1660089

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：739 / &

共 16 条

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[10] NEW MICROWAVE TECHNIQUES IN SURFACE RECOMBINATION AND LIFETIME STUDIES [J].

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