DETERMINATION OF SURFACE-ROUGHNESS OF THIN-FILMS USING MEASUREMENT OF ANGULAR-DEPENDENCE OF SCATTERED LIGHT FROM SURFACE PLASMA-WAVES

被引：66

作者：

KRETSCHMANN, E ^{[1
]}

机构：

[1] UNIV HAMBURG, INST ANGEW PHYS, HAMBURG, WEST GERMANY

来源：

OPTICS COMMUNICATIONS | 1974年 / 10卷 / 04期

关键词：

D O I：

10.1016/0030-4018(74)90362-9

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：353 / 356

页数：4

共 16 条

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[8] RADIATIVE DECAY OF NON RADIATIVE SURFACE PLASMONS EXCITED BY LIGHT [J].

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[9]

Kretschmann E., 1972, Optics Communications, V6, P185, DOI 10.1016/0030-4018(72)90224-6

[10]

KRETSCHMANN E, 1972, INT C THIN FILMS VEN

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