APPLICATIONS OF WAVE-FRONT DIVISION INTERFEROMETERS IN SOFT X-RAYS

被引：34

作者：

POLACK, F ^{[1
]}

JOYEUX, D ^{[1
]}

SVATOS, J ^{[1
]}

PHALIPPOU, D ^{[1
]}

机构：

[1] INST OPT,F-91403 ORSAY,FRANCE

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1995年 / 66卷 / 02期

关键词：

D O I：

10.1063/1.1145698

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The development of soft x-ray interferometry demands high quality optical elements and high brightness sources. However, the balance between these two requirements depends on the exact nature of the interferometer setups. Generally speaking, amplitude division interferometers require beam splitters, the optical quality of which remain a big technological issue. On the contrary, the high brightness sources needed by wavefront division interferometers are readily available, and will progress in the near future. Examples of such interferometers are given for various applications in development or in project. © 1995 American Institute of Physics.

引用

页码：2180 / 2183

页数：4

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