The measurement in absolute units of the intensities of X-ray reflections from crystalline powders

被引：16

作者：

Brindley, GW

机构：

来源：

PROCEEDINGS OF THE PHYSICAL SOCIETY | 1938年 / 50卷

关键词：

D O I：

10.1088/0959-5309/50/1/303

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：17 / 29

页数：13

共 18 条

[1] Brentano J, 1925, P PHYS SOC LOND, V37, P184
[2] For methodology for the quantitative measurement of the scattering of X-rays on microcrystalline layers.
Brentano, J.
[J]. ZEITSCHRIFT FUR PHYSIK, 1936, 99 (1-2): : 65 - 72
[3] On a procedure for direct photo parameterization low blacken and its application in the evaluation of X-ray-F-values.
Brentano, J.
[J]. ZEITSCHRIFT FUR PHYSIK, 1931, 70 (1-2): : 74 - 83
[4] Brentano J, 1928, PHILOS MAG, V6, P178
[5] Brentano J, 1927, PHILOS MAG, V4, P620
[6] BRENTANO JCM, 1935, P PHYS SOC LOND, V47, P932
[7] Brindley GW, 1935, PHILOS MAG, V20, P893
[8] Brindley GW, 1935, PHILOS MAG, V20, P882
[9] Brindley GW, 1935, PHILOS MAG, V20, P865
[10] Brindley GW, 1936, PHILOS MAG, V21, P778