LIFE TEST OF GAAS DH LASERS AT ROOM-TEMPERATURE

被引:7
作者
WAKITA, K
SHINODA, Y
NISHIDA, K
KAMEJIMA, T
FUJIWARA, T
KOMIYA, S
机构
[1] NIPPON TELEG & TEL PUBL CORP,MUSASHINO ELECT COMMUN LAB,MUSASHINO,TOKYO 180,JAPAN
[2] NIPPON ELECT CO LTD,CENT RES LABS,TAKATSU KU,KAWASAKI 211,JAPAN
[3] FUJITSU LABS LTD,NAKAHARA KU,KAWASAKI,JAPAN
关键词
D O I
10.1143/JJAP.16.2083
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:2083 / 2084
页数:2
相关论文
共 2 条
[1]   ACCELERATED LIFE TEST OF ALGAAS-GAAS DH LASERS [J].
FURUKAWA, Y ;
KOBAYASHI, T ;
WAKITA, K ;
KAWAKAMI, T ;
IWANE, G ;
HORIKOSHI, Y ;
SEKI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1977, 16 (08) :1495-1496
[2]   GAAS LASERS WITH CONSISTENTLY LOW DEGRADATION RATES AT ROOM-TEMPERATURE [J].
GOODWIN, AR ;
PETERS, JR ;
PION, M ;
BOURNE, WO .
APPLIED PHYSICS LETTERS, 1977, 30 (02) :110-113