CRYOSTAT FOR IRRADIATING AT 4.2 DEGREES K

被引:23
作者
SOSIN, A
NEELY, HH
机构
关键词
D O I
10.1063/1.1717562
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:922 / &
相关论文
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[1]   STORED ENERGY RELEASE IN COPPER FOLLOWING ELECTRON IRRADIATION BELOW 20-DEGREES-K [J].
MEECHAN, CJ ;
SOSIN, A .
PHYSICAL REVIEW, 1959, 113 (02) :422-430
[2]   THERMALLY ACTIVATED POINT DEFECT MIGRATION IN COPPER [J].
MEECHAN, CJ ;
SOSIN, A ;
BRINKMAN, JA .
PHYSICAL REVIEW, 1960, 120 (02) :411-419