A TEST-PATTERN-GENERATION ALGORITHM FOR SEQUENTIAL-CIRCUITS

被引：6

作者：

AUTH, E

SCHULZ, MH

机构：

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1991年 / 8卷 / 02期

关键词：

D O I：

10.1109/54.82040

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The authors present a deterministic test-pattern-generation algorithm for synchronous sequential circuits. The algorithm is based on the well-known method of reverse time processing, but it applies forward processing within time frames to avoid disadvantageous a priori determination of a path to be sensitized or of a primary output to which the fault effects must be propagated. The authors’ approach exploits techniques used for combinational circuits in the automatic test-pattern-generation system Socrates. © 1991 IEEE

引用

页码：72 / 86

页数：15

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