MAGNESIUM INSERTION IN VANADIUM-OXIDES - A STRUCTURAL STUDY

被引：29

作者：

NOVAK, P

SHKLOVER, V

NESPER, R

机构：

[1] SWISS FED INST TECHNOL,INST CRYSTALLOG & PETROG,CH-8092 ZURICH,SWITZERLAND

[2] SWISS FED INST TECHNOL,INORGAN CHEM LAB,CH-8092 ZURICH,SWITZERLAND

来源：

ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-INTERNATIONAL JOURNAL OF RESEARCH IN PHYSICAL CHEMISTRY & CHEMICAL PHYSICS | 1994年 / 185卷

关键词：

MAGNESIUM BATTERY; VANADIUM OXIDES; MG2+ ION INSERTION; X-RAY DIFFRACTION; ELECTROCHEMISTRY;

D O I：

10.1524/zpch.1994.185.Part_1.051

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

X-ray powder diffraction patterns of V2O5-related electrode materials [V2O5, NaV3O8 and Mg(V3O8)2] as well as of poly(tetrafluoroethylene)-bonded composite electrodes, containing chemically and electrochemically inserted Mg2+, were analysed before and after Mg2+ insertion. Transmission electron microscopy and both wavelength and energy dispersive electron probe microanalysis were applied for the determination of the composition and structure of different types of microparticles found in the electrode mass.

引用

页码：51 / 68

页数：18

共 28 条

[1]

Bachmann H. G., 1961, Z KRISTALLOGR, V115, P110, DOI DOI 10.1524/ZKRI.1961.115.1-2.110

[2] IONIC HYDRATION NUMBER IN V2O5 INTERCALATED XEROGELS MX(H2O)YV2O5 [J].