DEPENDENCE OF SURFACE SCREENING IN SEMICONDUCTORS ON THE SHORT-RANGE PROPERTIES OF THE BULK DIELECTRIC FUNCTION

被引：4

作者：

CINAL, M

DELSOLE, R

KRUPSKI, J

BARDYSZEWSKI, W

STRINATI, G

机构：

[1] UNIV ROMA 2,DIPARTIMENTO FIS,ROMA,ITALY

[2] UNIV WARSAW,INST FIZYKI TEORETYCZNEJ,PL-00681 WARSAW,POLAND

[3] UNIV ROME LA SAPIENZA,DEPARTIMENTO FIS,I-00185 ROME,ITALY

来源：

关键词：

D O I：

10.1016/0038-1098(87)90204-3

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：633 / 635

页数：3

共 7 条

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[3] GEOMETRY-DEPENDENT SI(2P) SURFACE CORE-LEVEL EXCITATIONS FOR SI(111) AND SI(100) SURFACES
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[J]. PHYSICAL REVIEW, 1962, 128 (05): : 2093 - +
[6] QUANTUM DIELECTRIC THEORY OF ELECTRONEGATIVITY IN COVALENT SYSTEMS .I. ELECTRONIC DIELECTRIC CONSTANT
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[J]. PHYSICAL REVIEW, 1969, 182 (03): : 891 - +
[7] Yin S., 1980, Journal of the Physical Society of Japan, V49, P105