PHOTOCONDUCTIVITY LIFETIME MEASUREMENTS ON HGCDTE USING A CONTACTLESS MICROWAVE TECHNIQUE

被引：34

作者：

CHEN, MC

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1988年 / 64卷 / 02期

关键词：

D O I：

10.1063/1.341901

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：945 / 947

页数：3

共 16 条

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