RESONANT SCATTERING OF LIGHT-ATOMS - MEASURING METHODS AND APPLICATIONS

被引:6
作者
GROCHOWSKI, J
SERDA, P
机构
关键词
D O I
10.12693/APhysPolA.82.147
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The paper describes measuring methods of weak resonant scattering signals occurring in X-ray diffraction pattern of a crystal containing light atoms (C, N, O, F) in its unit cell. Difficulties resulting from the large distance on the energy scale between the K-absorption edges of light atoms and contemporary available energy range of X-ray sources for diffraction experiments may be overcome using mixed synchrotron radiation and sealed tube measurements. Techniques such as high resolution synchrotron radiation diffraction experiment, low resolution azimuthal scan, top reflection azimuthal scan are discussed and their applications are presented. Several enantiomer correctness indicators, evaluating the confidence level of absolute structure determination, are applied for crystals containing oxygen or nitrogen as anomalous scatterers. Resonant scattering of light atoms, which are fundamental constituents of organic molecules and polymers, carries the information about the absolute structure. Growing importance of stereospecific drugs which follows recent recognition of drug-receptor interaction mechanism increases the demand for determination of drug molecule handedness. Investigation of absolute structure for molecules in their original shape (without the introduction of heavy anomalous scatterers) is potentially a vast application field of the described methodology.
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页码:147 / 156
页数:10
相关论文
共 25 条
[1]   STEREOCHEMISTRY, A BASIS FOR SOPHISTICATED NONSENSE IN PHARMACOKINETICS AND CLINICAL-PHARMACOLOGY [J].
ARIENS, EJ .
EUROPEAN JOURNAL OF CLINICAL PHARMACOLOGY, 1984, 26 (06) :663-668
[2]  
BEURSKENS G, 1980, CRYST STRUCT COMMUN, V9, P23
[3]   DETERMINATION OF THE ABSOLUTE CONFIGURATION OF OPTICALLY ACTIVE COMPOUNDS BY MEANS OF X-RAYS [J].
BIJVOET, JM ;
PEERDEMAN, AF ;
VANBOMMEL, AJ .
NATURE, 1951, 168 (4268) :271-272
[4]   Differences in the Intensity of X-Ray Reflection from the two 111-surfaces of Sphalerite [J].
Coster, D. ;
Knol, K. S. ;
Prins, J. A. .
ZEITSCHRIFT FUR PHYSIK, 1930, 63 (5-6) :345-369
[5]   RELATIVISTIC CALCULATION OF ANOMALOUS SCATTERING FACTORS FOR X-RAYS [J].
CROMER, DT ;
LIBERMAN, D .
JOURNAL OF CHEMICAL PHYSICS, 1970, 53 (05) :1891-&
[7]   ACCURATE STRUCTURE-ANALYSIS WITH SYNCHROTRON RADIATION - AN APPLICATION TO BORAZONE, CUBIC BN [J].
EICHHORN, K ;
KIRFEL, A ;
GROCHOWSKI, J ;
SERDA, P .
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE CRYSTAL ENGINEERING AND MATERIALS, 1991, 47 :843-848
[8]  
EICHHORN K, 1992, ACTA PHYS POL A, V82
[9]  
ENGEL DW, 1970, ACTA CRYSTALLOGR B, V28, P1496
[10]   ON ENANTIOMORPH-POLARITY ESTIMATION [J].
FLACK, HD .
ACTA CRYSTALLOGRAPHICA SECTION A, 1983, 39 (NOV) :876-881