PROPERTIES OF X-RAY GUIDES

被引：13

作者：

CHUNG, PS ^{[1
]}

PANTELL, RH ^{[1
]}

机构：

[1] UCL, DEPT ELECTR & ELECT ENGN, LONDON WC1E 7JE, ENGLAND

来源：

ELECTRONICS LETTERS | 1977年 / 13卷 / 18期

关键词：

D O I：

10.1049/el:19770381

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：527 / 529

页数：3

共 9 条

[1]

Beckmann P., 1963, SCATTERING ELECTROMA

[2]

Butler D. W., 1973, Micron, V4, P410, DOI 10.1016/0047-7206(73)90004-6

[3] The total reflexion of X-rays [J].

Compton, AH .

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[4]

LELY JA, 1951, PHILIPS TECH REV, V13, P96

[5] LASER-GENERATED PLASMAS AS A SOURCE OF X-RAYS FOR MEDICAL APPLICATIONS [J].

MALLOZZI, PJ ;

EPSTEIN, HM ;

APPLEBAU.DC ;

FAIRAND, BP ;

GALLAGHE.WJ ;

UECKER, RL ;

MUCKERHE.MC .

JOURNAL OF APPLIED PHYSICS, 1974, 45 (04) :1891-1895

[6]

MOSNER D, 1976, APPL PHYS LETT, V29, P105

[7] SURFACE STUDIES OF SOLIDS BY TOTAL REFLECTION OF X-RAYS [J].

PARRATT, LG .

PHYSICAL REVIEW, 1954, 95 (02) :359-369

[8] PROPAGATION OF X-RAYS IN WAVEGUIDES [J].

SPILLER, E ;

SEGMULLER, A .

APPLIED PHYSICS LETTERS, 1974, 24 (02) :60-61

[9] MEASUREMENTS ON AN X-RAY LIGHT PIPE AT 5.9 AND 14.4 KEV [J].

VETTERLING, WT ;

POUND, RV .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1976, 66 (10) :1048-1049

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