CURRENT CARRIER LIFETIMES DEDUCED FROM HALL COEFFICIENT AND RESISTIVITY MEASUREMENTS

被引:11
作者
HUNTER, LP
HUIBREGTSE, EJ
ANDERSON, RL
机构
来源
PHYSICAL REVIEW | 1953年 / 91卷 / 06期
关键词
D O I
10.1103/PhysRev.91.1315
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:1315 / 1320
页数:6
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[2]   DIFFUSION CURRENTS IN THE SEMICONDUCTOR HALL EFFECT [J].
LANDAUER, R ;
SWANSON, J .
PHYSICAL REVIEW, 1953, 91 (03) :555-560
[3]  
PRINCE MB, 1953, B AM PHYS SOC, V28, P10
[4]  
SHOCKLEY W, 1950, ELECT HOLES SEMICOND, P218
[5]  
SWANSON JM, COMMUNICATION