NONLINEAR OPTICAL PULSE-PROPAGATION IN A SEMICONDUCTOR MEDIUM IN THE TRANSIENT REGIME .2. INTERFEROMETRIC SAMPLING

被引:2
作者
FINLAYSON, N [1 ]
STEGEMAN, GI [1 ]
机构
[1] UNIV ARIZONA,CTR OPT SCI,TUCSON,AZ 85724
基金
美国国家科学基金会;
关键词
Interferometry - Semiconductor Materials--Optical Properties;
D O I
10.1109/3.53396
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We use a numerical model of pulse propagation in a semiconductor to simulate the technique of interferometric sampling of the semiconductor response to an optical pulse. Interferometric sampling is a form of time-resolved interferometry which combines elements of classical interferometry and pump-probe techniques to obtain the transient response of nonlinear refractive index and absorption changes in a material. The technique is shown to measure accurately saturated changes in phase and transmittance, as well as the interband recombination time. © 1990 IEEE
引用
收藏
页码:778 / 787
页数:10
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