INTENSITIES OF SURFACE DIFFRACTION SPOTS IN PLAN VIEW

被引：15

作者：

XU, P

MARKS, LD

机构：

[1] Department of Materials Science, Northwestern University, Evanston

来源：

ULTRAMICROSCOPY | 1992年 / 45卷 / 01期

关键词：

D O I：

10.1016/0304-3991(92)90046-M

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Values for the absolute intensities of surface diffraction spots in the plan-view geometry have been measured using an electron energy-loss spectrometer. The values are of the order of 10(-4) relative to the incident beam, which is consistent with multislice calculations. Measurements of the spectra around the spots in on-zone and off-zone orientations indicate that (for silicon) the main background signal is due to plasmon scattering.

引用

页码：155 / 157

页数：3

共 10 条

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