RAMAN-SCATTERING AND X-RAY-DIFFRACTION INVESTIGATIONS OF HIGHLY TEXTURED (PB1-XLAX)TIO3 THIN-FILMS

被引：13

作者：

FENG, ZC

KWAK, BS

ERBIL, A

BOATNER, LA

机构：

[1] GEORGIA INST TECHNOL,SCH PHYS,ATLANTA,GA 30332

[2] OAK RIDGE NATL LAB,DIV SOLID STATE,OAK RIDGE,TN 37831

来源：

APPLIED PHYSICS LETTERS | 1994年 / 64卷 / 18期

关键词：

D O I：

10.1063/1.111611

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Highly textured lead lanthanum titanate (PLT) thin films grown on Si(100) substrates by the metalorganic chemical vapor deposition technique are characterized using x-ray diffraction (XRD), Raman spectroscopy, and energy-dispersive x-ray analysis. The texturing consisted of an alignment of the {100} crystallographic axes of the film perpendicular to the Si substrate. The tetragonality of the films was found to decrease as the lanthanum concentration increased. Raman spectra exhibited features characteristic of bulk PLT, including the observation of the soft mode. Variations of the phonon modes for PLT have been investigated as a function of La concentration and sample temperature.

引用

页码：2350 / 2352

页数：3

共 13 条

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