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QUANTITATIVE X-RAY PHOTOELECTRON DIFFRACTION STUDIES OF SINGLE-CRYSTAL SILICATES

被引：12
作者：
EVANS, S
RAFTERY, E
机构：
来源：
SOLID STATE COMMUNICATIONS | 1980年 / 33卷 / 12期
关键词：
D O I：
10.1016/0038-1098(80)90793-0
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
引用
收藏
页码：1213 / 1215
页数：3
相关论文
共 4 条
[1]   X-RAY PHOTOELECTRON DIFFRACTION - NEW TECHNIQUE FOR STRUCTURAL STUDIES OF COMPLEX SOLIDS [J].
ADAMS, JM ;
EVANS, S ;
THOMAS, JM .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1978, 100 (10) :3260-3262
[2]  
DEER WA, 1962, ROCK FORMING MINERAL, V3, P7
[3]   SURFACE-STRUCTURE AND COMPOSITION OF LAYERED SILICATE MINERALS - NOVEL INSIGHTS FROM X-RAY PHOTOELECTRON DIFFRACTION, K-EMISSION SPECTROSCOPY AND COGNATE TECHNIQUES [J].
EVANS, S ;
ADAMS, JM ;
THOMAS, JM .
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1979, 292 (1399) :563-595
[4]   ANGULAR VARIATIONS IN CORE-LEVEL XPS PEAK INTENSITY RATIOS FROM SINGLE-CRYSTAL SOLIDS [J].
EVANS, S ;
RAFTERY, E ;
THOMAS, JM .
SURFACE SCIENCE, 1979, 89 (1-3) :64-75
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