A GENERAL-APPROACH TO THE ENDURANCE OF ELECTRICAL INSULATION UNDER TEMPERATURE AND VOLTAGE

被引：101

作者：

SIMONI, L

机构：

来源：

IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1981年 / 16卷 / 04期

关键词：

D O I：

10.1109/TEI.1981.298361

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：277 / 289

页数：13

共 17 条

[1]

DAKIN TW, 1971, 4TH P S EL INS MAT J

[2]

DAKIN TW, 1948, AIEE T, V67, P113

[3]

DAKIN TW, 1960, ELECTROTECHNOLOGY, P123

[4] APPLICATION OF EYRING MODEL TO CAPACITOR AGING DATA [J].

ENDICOTT, HS ;

HATCH, BD ;

SOHMER, RG .

IEEE TRANSACTIONS ON COMPONENT PARTS, 1965, CP12 (01) :34-&

[5]

Montsinger V. M., 1930, AIEE T, V49, P776

OCCHINI, E .

IEEE TRANSACTIONS ON POWER APPARATUS AND SYSTEMS, 1971, PA90 (06) :2671-&

[7]

OUDIN JM, 1968, REV GEN ELECTR, V77, P430

[8]

Pattini G., 1976, 1976 IEEE International Symposium on Electrical Insulation, P19

[9]

PATTINI G, 1979, 3RD P ISHV MIL

SHIOMI, H .