The effect of the electron beam on various mounting and coating media in scanning electron microscopy

被引:11
作者
Muir, M. D. [1 ]
Rampley, D. N. [1 ]
机构
[1] Imperial Coll Sci & Technol, Royal Sch Mines, Dept Geol, London SW7, England
关键词
D O I
10.1111/j.1365-2818.1969.tb00702.x
中图分类号
TH742 [显微镜];
学科分类号
摘要
Eight commonly used specimen adhesives were examined under the Stereoscan' scanning electron microscope to determine the effects of the electron beam on their surface topography. The adhesives were initially examined uncoated, and then coated variously with carbon, and seven different metals and alloys. The effect of the beam on the coated and uncoated adhesives was recorded. The results are presented in tabular form. The purpose of the experiments was to determine the extent of the damage, if any, produced by the beam, on the adhesive, and to try to discover the most damage-resistant combinations. While combinations are damage-free, some of the more easily damaged adhesives are regarded as being suitable for certain specialized purposes, where their special properties over-ride their susceptibility to beam damage.
引用
收藏
页码:145 / 150
页数:6
相关论文
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[1]  
OATLEY CW, 1966, SCI PROG, V54, P483