DETECTION OF TRANSMUTATIONAL ELEMENTS IN COPPER BY MEANS OF TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY USING SYNCHROTRON-RADIATION

被引：8

作者：

HEGEDUS, F

WOBRAUSCHEK, P

STRELI, C

WINKLER, P

RIEDER, R

LADISICH, W

VICTORIA, M

RYON, RW

SOMMER, WF

机构：

[1] UNIV VIENNA,ATOMINST,A-1020 VIENNA,AUSTRIA

[2] LAWRENCE LIVERMORE NATL LAB,LIVERMORE,CA 94550

[3] LOS ALAMOS NATL LAB,LOS ALAMOS,NM 87545

来源：

X-RAY SPECTROMETRY | 1995年 / 24卷 / 05期

关键词：

D O I：

10.1002/xrs.1300240508

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

High-purity copper samples were irradiated with high-energy protons and neutrons, The concentration of transmutational elements was measured by means of the total reflection x-ray fluorescence method using synchrotron radiation, The spectra of non-irradiated samples were substracted from the spectra of the irradiated samples, By this evaluation method, the minimum detectable concentration was as low as 1.5 mu g g(-1) in a copper matrix.

引用

页码：253 / 254

页数：2