ZnO:Er, (III) Nanosystems Analyzed by XPS

被引:9
作者
Armelao, Lidia [1 ,2 ]
Barreca, Davide [1 ,2 ]
Bottaro, Gregorio [1 ,2 ]
Gasparotto, Alberto [2 ,3 ]
Leonarduzzi, Daniele
Maragno, Cinzia [2 ,3 ]
Tondello, Eugenio [2 ,3 ]
机构
[1] ISTM CNR, Perugia, Italy
[2] INSTM, Dept Chem, Via Marzolo, I-35131 Padua, Italy
[3] Padova Univ, Padua, Italy
来源
SURFACE SCIENCE SPECTRA | 2006年 / 13卷 / 01期
关键词
ZnO:Er(III); nanosystems; rf-sputtering; sol-gel;
D O I
10.1116/11.20060301
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
ZnO:Er(III) nanosystems were synthesized by a combined rf-sputtering/sol-gel (SG) approach. In particular, the adopted route consists in the rf-sputtering of erbium (guest) onto as-prepared zinc oxide xerogels (host) obtained via sol-gel, followed by ex-situ heat treatments in air (300-600 degrees C, 1-5 h). The obtained samples were analyzed by glancing incidence x-ray diffraction (GIXRD), atomic force microscopy (AFM), secondary ion mass spectrometry (SIMS) and x-ray photoelectron spectroscopy (XPS), for a detailed investigation of their microstructure, surface morphology and chemical composition. The present work focuses on the XPS analysis of a selected ZnO: Er specimen, annealed at 400 degrees C for 5 h. Besides the wide scan spectrum, detailed spectra for the Zn 2p(3/2), Zn 3p, Er 4d, O ls and C 1s regions and related data are presented and discussed. (C) 2007 American Vacuum Society.
引用
收藏
页码:9 / 16
页数:8
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