CONTOUR MAPPING OF THE SPATIOTEMPORAL STATE OF POLARIZATION OF LIGHT

被引:52
作者
OHTSUKA, Y
OKA, K
机构
[1] Department of Engineering Science, Faculty of Engineering, Hokkaido University, Sapporo
来源
APPLIED OPTICS | 1994年 / 33卷 / 13期
关键词
POLARIZED LIGHT; SPATIOTEMPORAL SOP MAPPING;
D O I
10.1364/AO.33.002633
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A novel interferometric polarimeter capable of mapping a spatiotemporal change in the state of polarization (SOP) of light is described. The polarimeter has a reference beam of light with two orthogonal linearly polarized components that interfere with the counterpart components of an elliptically polarized signal beam. The resultant interference pattern is recorded by a computer by the use of a wideband metal-oxide semiconductor video camera. The interference pattern reduces to the ellipticity and azimuth of the ellipse at an instant of time, by which the spatiotemporal change in the SOP is mapped. No optical elements are used for the control of polarization in the polarimeter, and this allows for the mapping of a rapid change in the SOP. Successful experiments are demonstrated by generating an elliptically polarized beam whose SOP varies in space and time.
引用
收藏
页码:2633 / 2636
页数:4
相关论文
共 7 条
[1]  
Azzam R. M. A., 1988, ELLIPSOMETRY POLARIZ
[2]  
GOMES JFS, 1987, OPTICAL METROLOGY, P677
[3]   HIGH-RESOLUTION MOIRE PHOTOGRAPHY - APPLICATION TO DYNAMIC STRESS-ANALYSIS [J].
HUNTLEY, JM ;
FIELD, JE .
OPTICAL ENGINEERING, 1989, 28 (08) :926-933
[4]   4-CHANNEL POLARIMETER FOR TIME-RESOLVED ELLIPSOMETRY [J].
JELLISON, GE .
OPTICS LETTERS, 1987, 12 (10) :766-768
[5]   POLARIMETRY FOR SPATIOTEMPORAL PHOTOELASTIC ANALYSIS [J].
OKA, K ;
OHTSUKA, Y .
EXPERIMENTAL MECHANICS, 1993, 33 (01) :44-48
[6]   OPTICAL HETERODYNE POLARIMETER FOR STUDYING SPACE-DEPENDENT AND TIME-DEPENDENT STATE OF POLARIZATION OF LIGHT [J].
OKA, K ;
TAKEDA, T ;
OHTSUKA, Y .
JOURNAL OF MODERN OPTICS, 1991, 38 (08) :1567-1580
[7]   FOURIER-TRANSFORM METHOD OF FRINGE-PATTERN ANALYSIS FOR COMPUTER-BASED TOPOGRAPHY AND INTERFEROMETRY [J].
TAKEDA, M ;
INA, H ;
KOBAYASHI, S .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (01) :156-160