FIELD, ANGULAR, AND DEFECT DEPENDENCE OF CRITICAL CURRENT OF NB3SN FOR T LESS-THAN-OR-EQUAL-TO 4.2 DEGREESK

被引：18

作者：

CULLEN, GW ^{[1
]}

CODY, GD ^{[1
]}

机构：

[1] RCA LABS,PRINCETON,NJ 08540

来源：

JOURNAL OF APPLIED PHYSICS | 1973年 / 44卷 / 06期

关键词：

D O I：

10.1063/1.1662658

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：2838 / 2842

页数：5

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[9] EFFECT OF FAST-NEUTRON-INDUCED DEFECTS ON CURRENT CARRYING BEHAVIOR OF SUPERCONDUCTING NB3SN ( FLUX JUMPING 4.2 DEGREES K CRITICAL CURRENT DENSITY INCREASED E )
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